홈
탐색
nav.journalClub
트렌드
더보기
synapse
⌘+K
언어
한국어
한국어
A protocol for in-situ high resolution strain mapping at elevated temperature | Synapse
March 3, 2026
Open Access
A protocol for in-situ high resolution strain mapping at elevated temperature
DL
D. Lunt
AS
AD Smith
JD
J.M. Donoghue
See all
Key Points
Strain mapping enables precise observation of material behavior under elevated temperatures, improving understanding of thermal effects.
Key evidence includes achieving high resolution in strain measurements, essential for accurate material evaluations.
Protocol for in-situ measuring methods enhances the assessment of strain under varying temperature conditions.
Such methodologies support better design practices in engineering applications, yet external validation is advisable.
Read Full Paper
externally
Mark Helpful
Like
Save
Bookmark
Relay
Share
View Full Paper
Cite This Study
Copy
Lunt et al. (Wed,) studied this question.
synapsesocial.com/papers/69a75ff3c6e9836116a2c50b
https://doi.org/https://doi.org/10.1016/j.matchar.2026.116119
Mark Helpful
Like
Save
Bookmark
Relay
Share
View Full Paper