What question did this study set out to answer?

To present the modernization and extension of longitudinal electron beam diagnostics at FLASH.

January 22, 2026JACOW0 citationsOpen Access

Recent upgrades of longitudinal diagnostics at FLASH

MCMarie Kristin Czwalinna BSBernd Steffen JRJan Roever

Key Points

To present the modernization and extension of longitudinal electron beam diagnostics at FLASH.
Upgraded diagnostics include electro-optical bunch length detector, bunch compression monitor, and bunch arrival-time monitor.
Modernized control interface for THz intensity spectrometer allows easier operation for non-experts.
Overview of the commissioning process for new diagnostic tools.
Enhanced measurement capabilities for electron beam diagnostics.
Successful integration of new diagnostic devices into the FLASH facility.
Improved user accessibility for conducting bunch profile measurements.

Abstract

In the framework of the recent FLASH2020+ upgrade program, the longitudinal electron beam diagnostics of the FLASH accelerator had been modernized and extended by additional devices, including an electro-optical bunch length detector (EOD1), as well as an additional bunch compression monitor (BCM 2) and a bunch arrival-time monitor (BAM 3) in the new direct seeding beamline FLASH1. Also, the THz intensity spectrometer (CRISP 4) received a modernized control interface that will allow non-experts to perform bunch profile measurements. The paper presents an overview on the current status of the longitudinal electron beam diagnostics at FLASH and the ongoing (re-)commissioning.

KI fragen

Bookmark

View Full Paper

Cite This Study

Czwalinna et al. (Tue,) studied this question.

synapsesocial.com/papers/6971be50642b1836717e2f1b https://doi.org/https://doi.org/10.18429/jacow-ibic2025-wepco23

KI fragen

Bookmark

View Full Paper