Defect inspection of Printed Circuit Board (PCB) is essential for maintaining the safety and reliability of electronic products. With the continuous trend toward smaller components and higher integration levels, identifying tiny imperfections on densely packed PCB structures has become increasingly difficult and remains a major challenge for current inspection systems. To tackle this problem, this study proposes the Multi-scale Edge-Aware Enhanced Detection Transformer (MEE-DETR), a deep learning-based object detection method. Building upon the RT-DETR framework, which is grounded in Transformer-based machine learning, the proposed approach systematically introduces enhancements at three levels: backbone feature extraction, feature interaction, and multi-scale feature fusion. First, the proposed Edge-Strengthened Backbone Network (ESBN) constructs multi-scale edge extraction and semantic fusion pathways, effectively strengthening the structural representation of shallow defect edges. Second, the Entanglement Transformer Block (ETB), synergistically integrates frequency self-attention, spatial self-attention, and a frequency–spatial entangled feed-forward network, enabling deep cross-domain information interaction and consistent feature representation. Finally, the proposed Adaptive Enhancement Feature Pyramid Network (AEFPN), incorporating the Adaptive Cross-scale Fusion Module (ACFM) for cross-scale adaptive weighting and the Enhanced Feature Extraction C3 Module (EFEC3) for local nonlinear enhancement, substantially improves detail preservation and semantic balance during feature fusion. Experiments conducted on the PKU-Market-PCB dataset reveal that MEE-DETR delivers notable performance gains. Specifically, Precision, Recall, and mAP50–95 improve by 2.5%, 9.4%, and 4.2%, respectively. In addition, the model’s parameter size is reduced by 40.7%. These results collectively indicate that MEE-DETR achieves excellent detection performance with a lightweight network architecture.
Ma et al. (Fri,) studied this question.