Competition between intrinsic and defective luminescence in GaN microdisks under nanoindentation
Key Points
Intrinsic luminescence dominates when GaN microdisks are undisturbed, but this changes under nanoindentation, impacting overall luminescent behavior.
Findings indicate a significant shift in luminescence intensity, measuring a 30% decrease in intrinsic luminescence compared to defective luminescence under stress.
Assessment using nanoindentation experiments revealed varying optical properties influenced by luminescence competition in GaN microdisks.
This highlights the need for careful consideration in applications requiring stable luminescence, particularly under mechanical stress.