Thermoreflectance imaging to characterize Joule heating, current, and junction resistance in silver-nanowire networks

Key Points

• Characterizing junction resistance reveals the efficiency of silver-nanowire networks under current.
• Thermoreflectance imaging enables precise measurement of Joule heating in conductive materials like silver-nanowires.
• By examining current flow, insights into optimizing nanowire networks for electronic applications are obtained.
• This analysis may facilitate improvements in flexible electronic designs and their thermal management.