A multi-scale characterization framework for macroscopic nonlinearity and microscopic domain responses in polycrystalline ferroelectric thin films

Key Points

• Nonlinearity in polycrystalline ferroelectric thin films shows significant domain response variations.
• Key evidence includes the multi-scale analysis indicating complex behavior across different measurement techniques.
• This observational analysis investigates ferroelectric domain responses using advanced characterization methods.
• Findings may enable enhanced applications in electronic devices, highlighting the need for further exploration in material behaviors.