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Study on the Influence Mechanism of the Void Structure on the Directional Propagation of Cracks Induced by High-Voltage Electric Pulses | Synapse
March 3, 2026
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Study on the Influence Mechanism of the Void Structure on the Directional Propagation of Cracks Induced by High-Voltage Electric Pulses
JG
Jun Guo
QL
Quan Liu
GF
Guorui Feng
Institute of Disaster Prevention
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Key Points
Crack propagation is significantly influenced by the void structure present in the material, impacting its longevity.
The study identified key mechanical properties that affect how cracks spread when subjected to high-voltage electric pulses.
Analysis reveals a relationship between stress distribution and crack propagation directions influenced by void structures.
Understanding these dynamics may lead to improved designs in materials exposed to electrical stresses, enhancing safety.
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Guo et al. (Mon,) studied this question.
synapsesocial.com/papers/69a7667fbadf0bb9e87dd3b1
https://doi.org/https://doi.org/10.1007/s00603-026-05327-z