Development and Characterization of Poly(Vinylidene Fluoride)/Sn-Doped CaCu3Ti4O12 Thin Film with Enhanced Dielectric and Mechanical Properties

Key Points

• Enhanced dielectric properties observed in poly(vinylidene fluoride) thin films with sn-doped CaCu3Ti4O12 additives.
• With a notable improvement of 25% in dielectric constant over standard PVDF, these materials showcase significant potential for electronic applications.
• Characterization via X-ray diffraction and scanning electron microscopy reveals the structural integrity of the thin films.
• Results indicate strong mechanical properties, underscoring the material's suitability for flexible electronic devices.