Metody synchronizacji czasowej sond pomiarowych do testu dwupulsowego (DPT) tranzystorów SiC MOSFET

Key Points

• The research aims to explore methods for synchronizing measurement probes during the two-pulse test of SiC MOSFETs.
• Exploration of synchronization techniques
• Application of two-pulse testing methods
• Evaluation of measurement accuracy
• Identification of key synchronization methods
• Enhanced accuracy in probe measurements for SiC MOSFETs