Nanometer-sized materials show special electronic and optical properties due to quantum size effects. While the evaluation of these properties is quite important in material science and engineering in the next generation, the methods to simultaneously measure electronic and optical properties within the nanometer level have not been currently established yet. Tipcollected tunneling electron luminescence microscope is a novel microscope using a transparent conductive (CT) probe and can simultaneously evaluate the electronic and optical properties as well as the atomic configuration at the same lattice position. Since the reproducible production of the CT probe is difficult with keeping the constant quality, investigation is conducted to simplify the production process and improve the quality. In this study, as a preliminary step to deposit an indium tin oxide (ITO) film, which is a transparent conductive material, onto the probe surface, an ITO film as deposited onto a quartz glass substrate with almost the same compositions as the quartz fiber. We investigated the changes in the electrical conductivity, optical transparency, and crystalline structure by following annealing treatments and found the optimal growth of the ITO film on the quartz fiber.
Hoshino et al. (Thu,) studied this question.