Anisotropic silver nanoparticles embedded in the single-crystalline silicon with crystallographic orientation (110) were fabricated using high-temperature annealing of silver island film obtained by galvanic displacement reaction. Due to crystallographic orientation of silicon wafer used as a substrate, embedded particles have a “boat” shape with 2-fold symmetry. Using spectroscopic ellipsometry, it was revealed that thus obtained structures demonstrate strong optical anisotropy in the visible spectral range at an angle of light incidence of 74°. Measurements were carried out at different angles of sample rotation (0°, 45°, and 90°) relative to the plane of light incidence. Using such studies, it was possible to detect a change in the position of the localized plasmon mode arising in the structure, with the maximum spectral position shift being 120 nm.
Zharova et al. (Mon,) studied this question.