CsPbBr 3 –Nanodiamonds Hybrid Wafers for Mechanically Robust, High‐Performance X‐Ray Detection

ABSTRACT CsPbBr 3 –nanodiamonds (NDs) hybrid wafers are developed through a scalable solid‐state grinding and cold‑pressing approach for high‑performance X‑ray detection. Incorporation of trace NDs modulates the mechanochemical reaction environment, accelerates CsPbBr 3 formation, and suppresses CsPb 2 Br 5 impurities. Structural, chemical, and optical analyses reveal that NDs promote heterogeneous nucleation, enhance crystallinity, bridge grain boundaries, and passivate interfacial defects via coordination between ND surface groups and undercoordinated Pb 2 + . The optimized hybrid wafer (CsPbBr 3 :NDs = 10:0.5) exhibits improved packing density, reduced reflectivity, enhanced charge transport, and significantly lower dark current. Consequently, the device achieves high sensitivity (2796.68 µC Gy air −1 cm −2 ), stable switching behavior, and an improved detection limit of 11.33 µGy s −1 . Thermal imaging measurements further confirm that NDs enhance heat dissipation, contributing to stable operation under continuous X‑ray exposure. This work demonstrates a robust design strategy for perovskite–diamond hybrid wafers and provides a practical route toward durable, low‑cost, and high‑sensitivity solid‑state X‑ray detectors.