The aim is to investigate the origin of long-wavelength variations in crustal thickness on telluric planets.
Data collection and analysis of crustal thickness measurements.
Utilization of specific software to model variations and assess geological implications.
Identified significant long-wavelength variations in crustal thickness on telluric planets.
Abstract
This is the data and software used for the paper : Origin of long-wavelength variations in crustal thickness on telluric planet submitted to Geophysical Research Letters.