The Advanced Photon Source (APS) has been upgraded with a multi-bend achromat lattice, achieving significantly reduced electron beam emittance and enhanced X-ray coherence. Precise characterization of these properties is essential for optimizing beamline performance and enabling new experiments that take full advantage of the upgraded source. We report on measurements of source size and transverse coherence properties using grating interferometry at two beamlines: the APS 3-ID-B undulator beamline and the 1-BM-B bending magnet beamline. The results confirm the world-record horizontal emittance of the upgraded APS below 30 pm rad and validate the theoretical design parameters. We further investigate the impact of optical aberrations and mechanical vibrations at the 12-ID-C beamline on coherence preservation. These measurements establish a benchmark for future beamline enhancements and demonstrate the effectiveness of grating interferometry for high-precision beam characterization. Our findings provide critical insights into synchrotron beam dynamics, coherence degradation mechanisms, and strategies for optimizing beamline X-ray optics at next-generation light sources.
Shi et al. (2025) studied this question.