Featuring of emissive semiconductor Poly(phenylene vinylene) layer on emission peak and life span materialism behaviour of Poly(3,4-ethylenedioxythiophene): PSS (polystyrene sulfonate)

Abstract Poly(3,4-ethylenedioxythiophene): polystyrene sulfonate (PEDOT:PSS) is a good hole transport layer (HTL), which has unique properties such as higher electrical conductivity, flexibility, improved optical transparency, and lightweight. However, it encountered difficulties with hygroscopic and acidic leads, which limit overall performance and reduce lifetime. This research aims to address previous shortcomings and fill existing knowledge gaps by systematically examining the effects of Poly(phenylene vinylene) (PPV) layers with varying thicknesses (50, 60, 70, and 80 nm) on the performance materialism characteristics of PEDOT:PSS-based organic light-emitting diodes (OLEDs). Devices were fabricated using spin coating for PEDOT:PSS deposition and thermal evaporation for PPV layer formation. Characterization of the fabricated devices was undertaken using key performance metrics, including luminance, current efficiency, external quantum efficiency (EQE), light-emission spectrum, and lifetime analysis. X-ray diffraction and surface morphology were utilized to investigate structural modifications. The results showed that the PPV’s emissive thickness-dependent performance was optimal at 70 nm. The optimized OLED structure exhibits a luminance of 3850 cd/m 2 and a current efficiency of 3.8 cd/A. The EQE was reported to be 3.10 %, with a turn-on voltage of 3.4 V. The crystalline size was measured at 11.8 nm, and the emission peak was observed at 530 nm. The PPV incorporation improved device stability, with an operational lifetime of 850 h ( T 50 at 100 cd/m 2 ), and enhanced charge mobility of 3.2 × 10 −5 cm 2 /V.s. The surface morphology showed a PPV layer in the PEDOT: PSS structure. This study offers insights into an effective solution-processed OLED for advancing optoelectronic applications.