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March 3, 20260 citationsOpen Access

Electron and Ion Emission Induced by Intense THz Pulses in Atom Probe Tomography

Study of Electron and Ion Emission by Intense THz Transient : Application to the Atom Probe Tomography

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MKMichella Karam

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Overview

Observational analysis reveals enhanced charge states in atom probe tomography using THz pulses, suggesting improved material analysis techniques.

Key Points

  • Enhanced ion emission occurs due to intense THz pulses, and surface evaporation is effectively triggered in select nanostructures.
  • The study demonstrates that THz pulses increase charge states of ions, particularly benefiting materials like LaB6, germanium, and silicon.
  • Experimental analysis, combined with numerical simulations, validates the efficiency of THz pulses in driving electron and ion dynamics.
  • Acknowledges challenges like low conductivity and Schottky barrier effects, highlighting the need for optimized conditions for effective material analysis.

Cite This Study

Michella Karam (2025) studied this question.

synapsesocial.com/papers/69a760edc6e9836116a2e39ahttps://www.theses.fr/2025NORMR079/document
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