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January 21, 2026Advanced Functional Materials0 citations

Dual‐Input Electrically and Optically Tunable Memtransistor for Multilevel Memory in Intelligent Electronic Systems

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SLSujin LeeMKMin Seong KimJAJong Bin An

Key Points

  • The aim is to develop a dual-input memtransistor that enhances multilevel memory capabilities by utilizing both electrical and optical programming.
  • Introduced a dual-input modulation layer using magnesium oxide (MgO X) into an oxide memtransistor.
  • Measured several parameters under electrical and optical stimulation, including hysteresis and photoresponse.
  • Assessed the performance by evaluating drain current levels across different input methods.
  • Achieved a hysteresis increase of 14.38 V under electrical input.
  • Optical input showed significant photoresponsivity of 751.375 A/W and photosensitivity of 2.89 x 10^5.
  • The device demonstrated 64 distinct drain current levels with dual input capabilities.

Abstract

ABSTRACT The pursuit of multibit memory has intensified as high‐density storage becomes increasingly critical. However, most oxide devices still depend on a single programming stimulus, restricting tunable current ranges and multilevel capability. Here, we overcome this limitation by introducing a magnesium oxide (MgO X ) dual‐input modulation layer (DML) into an oxide memtransistor, enabling dual electrical and optical programming. This design achieves broad and tunable current‐level modulation, resulting in robust multilevel memory operation. Under the electrical input, the proposed memtransistor shows an increased hysteresis of 14.38 V. Under the optical input (red light illumination at 5 mW/mm 2 ), the photoresponsivity, photosensitivity, and detectivity of the device increased to 751.375 A/W, 2.89 × 10 5 , and 6.98 × 10 10 Jones, respectively. Electrical inputs provided high‐current level modulation (1.51 × 10 −8 ∼ 8.28 × 10 −7 A), whereas optical inputs enabled tunable low‐current level ranges (8.74 × 10 −7 ∼ 2.46 × 10 −5 A). This result indicates that electron trapping and de‐trapping within the DML enabled operation via an electrical input. Simultaneously, the increase in the valence band maximum of the oxide semiconductor was caused by the oxygen vacancies generated through the DML‐facilitated operation via optical input. Furthermore, 64 drain current levels were successfully demonstrated under both inputs.

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Cite This Study

Lee et al. (2026) studied this question.

synapsesocial.com/papers/69706c09b6488063ad5c17bfhttps://doi.org/10.1002/adfm.202530711
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