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Synapse
February 2, 2026Nanoscale0 citationsOpen Access

The impact on image formation of inevitable tip bending with modern high resolution atomic force microscopy probes

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XCXinyue ChenHSHarrison C. SwiftPHPatrick Hole

Key Points

  • To investigate how tip bending affects image formation in atomic force microscopy.
  • Analyzed probe behaviors during imaging processes
  • Evaluated high-resolution imaging capabilities
  • Measured displacement caused by tip bending
  • Tip bending leads to significant probe displacement
  • High-resolution imaging quality is compromised
  • Imaging accuracy decreases with increased bending

Abstract

Inevitable tip bending in atomic force microscopy drives large probe displacement, compromising high-resolution imaging.

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Cite This Study

Chen et al. (2026) studied this question.

synapsesocial.com/papers/6980fde8c1c9540dea80fa6chttps://doi.org/10.1039/d5nr02107c
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