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February 21, 2026Advanced Electronic Materials1 citationsOpen Access

Aging and Electrical Stability of DNTT Honey‐Gated OFETs

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DVDouglas Henrique VieiraAPAna Caroline De PaulaJDJosé D. F. Dias

Key Points

  • The aim is to evaluate the electrical performance and stability of honey-gated OFETs using DNTT as an active layer.
  • Developed honey-gated OFETs using natural honey electrolytes and DNTT active layer.
  • Assessed stability through short-term (five days) and long-term (five weeks) testing with multiple sweeps.
  • Evaluated performance degradation related to structural disorder and trap formation due to aging.
  • Devices showed I on /I off ratio of approximately 10^3 and transconductance of 10.42 µS.
  • Stability tests revealed minimal parameter shifts initially, followed by gradual degradation over time.
  • Drain current switching demonstrated fast reversible gating without permanent chemical changes.

Abstract

ABSTRACT Developing transistors that combine high electrical performance, operational stability, and environmental sustainability remains a challenge. Electrolyte‐gated organic field‐effect transistors (EGOFETs) address this issue by replacing the insulating layer with sustainable electrolytes, enabling low‐voltage operation and biosensing capabilities. In this work, we demonstrate honey‐gated OFETs using natural honey as a sustainable electrolyte and dinaphtho2,3‐b:2',3'‐fthieno3,2‐bthiophene (DNTT) as the active layer. The devices exhibited an I on /I off ≈ 10 3 , a transconductance of 10.42 µS, and a low threshold voltage of −0.74 V. Stability was assessed through short‐term tests (five days, 40 sweeps/day), revealing minimal parameter shifts, and long‐term tests (five weeks, 15 sweeps/week), showing gradual degradation. The device continued to operate with high performance after the honey droplet was removed and a fresh one was reapplied onto the DNTT. Under pulsed gate operation, the drain current switched by three orders of magnitude within 4 s, confirming fast, reversible gating and the absence of permanent channel doping or chemical reactions. The observed performance decline stems from structural disorder and trap formation induced by aging. Overall, DNTT honey‐gated OFETs exhibit stable operation for at least a short period before gradual degradation, highlighting their potential as a platform for sustainable electronics.

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Cite This Study

Vieira et al. (2026) studied this question.

synapsesocial.com/papers/69994c5d873532290d020bb9https://doi.org/10.1002/aelm.202500786
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