Development of Resistant Lines against Leaf Blight Disease of Withania somnifera (L.) Dunal. Caused by Alternaria alternata through In vitro Selection

Key Points

• Resistant lines demonstrate enhanced tolerance to leaf blight disease symptoms, promoting better crop yield.
• Analysis reveals significant resistance in selected lines after in vitro selection against Alternaria alternata.
• Assessment using in vitro selection techniques successfully develops resistant lines for Withania somnifera against pathogens.
• Implications suggest improved agricultural practices may stem from the findings of resistant cultivars, supporting sustainability.

Abstract