Multi-level application of microscale pumping forces: study on pre-enrichment of trace heavy metal ions using dual membrane chips

Key Points

• Enhanced pre-enrichment of heavy metal ions occurs through microscale pumping forces, significantly improving detection sensitivity.
• Heavily metal ions were pre-enriched by 30% using dual membrane chips, facilitating better trace element analysis.
• Assessment using advanced microscale pumping techniques and dual membrane chips shows potential for environmental applications.
• This highlights the need for further studies on microscale systems for efficient heavy metal monitoring in various settings.