Accurate interlayer distance measurement in bilayer graphene on SiC by high-resolution electron microscopy data analysis

Puntos clave

• Accurate interlayer distance measurement was achieved for bilayer graphene on silicon carbide.
• Data analysis revealed a precise distance of 0.335 nm, highlighting the effectiveness of high-resolution techniques.
• The approach used high-resolution electron microscopy to analyze the structural properties of bilayer graphene.
• These findings could enhance understanding and applications of graphene materials in advanced technologies.