PulseExploreJournal ClubDebatesTrendingResearchersJournals
Instagram
HomeExploreJournal ClubTrending
Synapse
⌘+K
Synapse
March 10, 2026physica status solidi (a)0 citations

Transmission Electron Microscopy Observation of Basal–Plane Dislocation Slip in 2‐Inch Diameter AlN Single‐Crystal

View Full Paper
АMА. V. MyasoedovTAT. S. ArgunovaMGM. Yu. Gutkin

Key Points

  • This research aims to analyze the interactions of dislocations in aluminum nitride single-crystals.
  • Characterization of a 64 mm diameter AlN single-crystal using transmission electron microscopy.
  • Observation of threading and basal plane dislocations.
  • Investigation of dislocation interactions and transformations using Burgers vectors.
  • Threading dislocations were observed interacting with basal plane dislocations.
  • An inclined threading dislocation transformed into a basal plane dislocation.
  • Dislocations exhibit complex behaviors rather than simply threading along the growth axis.

Abstract

Aluminum nitride bulk single‐crystal with a diameter of 64 mm has been characterized using transmission electron microscopy (TEM). Threading dislocations (TDs), basal plane dislocations (BPDs), and low‐angle boundaries have been observed, and their interactions have been investigated. Special attention was given to the basal–plane slip of –screw and mixed dislocations. By analyzing the Burgers vectors and line orientations using different diffraction vectors, the reaction of a BPD with a wall of inclined TDs was determined. The transformation of an inclined TD into a BPD was observed. The obtained results confirm that dislocations do not simply thread along the growth axis. The formal concept of defect propagation gives way to a deliberate consideration of their evolution during early and more advanced stages of crystal growth.

Ask AI
Helpful
Bookmark
Share
View Full Paper

Cite This Study

Myasoedov et al. (2026) studied this question.

synapsesocial.com/papers/69af955970916d39fea4cc44https://doi.org/10.1002/pssa.202500731
Ask AI
Helpful
Bookmark
Share
View Full Paper