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March 26, 2026The Journal of Physical Chemistry Letters0 citations

Nonmonotonic Strain Dependence of Defect-Assisted Nonradiative Recombination in MAPbI 3 Revealed by Nonadiabatic Dynamics

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JZJ. W. ZhanWLWenjun Lin

Key Points

  • The research aims to understand how tensile strain influences defect-assisted nonradiative recombination in MAPbI3.
  • Conducted ab initio nonadiabatic molecular dynamics simulations
  • Examined carrier dynamics in MAPbI3 perovskites with lead vacancies
  • Investigated the effects of moderate to excessive tensile strain on carrier lifetimes
  • Moderate strain suppresses nonradiative recombination, extending carrier lifetimes
  • Excessive strain accelerates carrier recombination due to deeper trap states
  • Tensile strain induces the formation of I-I dimers and significant local lattice distortions
  • Increased bandgap correlates with tensile strain, owing to enhanced antibonding character

Abstract

Here, we employed ab initio nonadiabatic molecular dynamics simulations to investigate the carrier dynamics in methylammonium lead iodide (MAPbI3) perovskites with lead vacancies under tensile strain. Our results reveal that moderate strain effectively suppresses nonradiative recombination and extends carrier lifetimes, while excessive strain accelerates carrier recombination due to the formation of deeper trap states, negatively affecting device performance. Significant tensile strain induces the formation of I-I dimers, leading to severe local lattice distortion characterized by the elongation of Pb-I bonds and the shortening of I-I bonds at the lead vacancy sites. Furthermore, the bandgap increases with tensile strain, attributed to the stronger antibonding character in the valence band compared to the conduction band. This work provides valuable insights into defect-mediated carrier relaxation dynamics and offers theoretical guidance for defect engineering in perovskite solar cells and related devices.

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Cite This Study

Zhan et al. (2026) studied this question.

synapsesocial.com/papers/69c4ccaffdc3bde4489180f9https://doi.org/10.1021/acs.jpclett.6c00645
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