We report kinetic characteristics of the electron drift in neon for the reduced electric field strengths in the range of 0.001 Td < E/N < 10000 Td. The drift velocity, effective temperature, and ionization coefficient are calculated using the Monte Carlo simulation. For the cases of strong and ultrastrong fields, 100 Td < E/N < 10000 Td, the calculation results are obtained for two models of electron escape from the system: (1) the avalanche model with multiplication and (2) the model with the escape of the most energetic electron to the wall in the system during the ionization event or transition to the runaway regime. For the drift velocity, effective temperature, and ionization coefficient, their analytical approximations from the reduced field strength are obtained and presented.
Maiorov et al. (2026) studied this question.