Smart Sensor Network Architecture with Machine Learning-Based Predictive Monitoring for High-Complexity Computed Tomography Systems

This study addresses the need for intelligent condition monitoring in high-complexity medical imaging systems by proposing a smart sensing architecture for the Revolution EVO Computed Tomography (CT) scanner. Ensuring operational reliability and minimizing unexpected downtime remain critical challenges in advanced CT platforms, motivating the integration of distributed sensing and data-driven analytics. System logs spanning August 2024 to October 2025 were processed into 10-min intervals and converted into a structured dataset comprising 76 features derived from operational events, scanning parameters, and temporal dynamics. Two supervised learning models, the Support Vector Machine (SVM) and Artificial Neural Network (ANN), were trained to identify abnormal operating conditions. Both models delivered excellent classification performance, achieving an accuracy of 0.973. The SVM demonstrated balanced precision, recall, and F1-score metrics of 0.973, while the ANN outperformed in ranking and sensitivity to anomalies with an AUROC of 0.993 and an AUPRC of 0.976. This framework highlights the potential of sensor-driven machine learning in enabling early detection of system anomalies and optimizing maintenance planning within clinical CT environments.