Virtual Stress Testing for Quantum Processors: A Digital Twin Workflow

We present a simulation workflow for virtual stress testing of superconducting quantum processors, analogous toHighly Accelerated Life Testing (HALT) in semiconductor manufacturing. For each sampled configuration, a backend factoryinstantiates a fresh digital twin with perturbed noise parameters and evaluates Quantum Volume, systematically mapping whereperformance collapses under manufacturing variation. The workflow operates on a ten-dimensional configuration space covering eight hardware parameter classes and two spatial distribution parameters. Error and spatial models are explicit, interchangeable modeling choices: they can be replaced without modifying the sampling or evaluation logic. The resulting distribution identifies per-parameter collapse thresholds and yield, providing a quantitative basis for procurement acceptance testing and manufacturing tolerance specification. The workflow is backend and benchmark-agnostic and requires only calibration data - no physical hardware access. This manuscript is a preprint.