This article addresses the relevant scientific and technical problem of ensuring the operational reliability of modern electronic warfare and weapons systems by improving the methods for technical diagnostics of their component base. The relevance of the study is driven by the rapid transition of military equipment to the use of high-density integrated circuits, which necessitates the development of non-destructive and non-contact methods for monitoring their actual condition. The main focus is placed on the development of a diagnostic model for a complementary metal-oxide-semiconductor output translator, adapted for use within a non-contact induction diagnostic method. The problem addressed in this work lies in the fact that traditional approaches to technical state assessment often ignore specific physical degradation processes inherent to structures, leading to unreliable remaining useful life predictions. The proposed solution is based on the advancement of existing models for transistor-transistor logic, with their fundamental modernization to align with the physics of semiconductor processes in modern integrated circuits. The scientific novelty of the results consists in the detailed consideration of such degradation factors as charge trapping in the gate dielectric, hot carrier injection, and negative bias temperature instability. During the study, a stable mathematical relationship was analytically established between the changes in the translator output currents I⁰, I¹ in logical zero and one states and the total degradation of the transistor threshold voltage Vₜh (t). This enabled the derivation of a universal calculation formula for determining the individual remaining useful life of the component (t^), which is a key indicator for predictive maintenance systems. The proposed model allows not only for the detection of a fault but also for deep defect localization and forecasting the future operability of electronic equipment under intensive operational conditions. The practical significance of the work is confirmed by the possibility of integrating the developed model into automated diagnostic systems, which will significantly increase the combat readiness of units by preventing sudden failures of critical electronic modules. Thus, the research results provide a foundation for transitioning to condition-based maintenance of military equipment, minimizing the risks of failure in communication and control systems.
Kuzavkov et al. (Fri,) studied this question.